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Genetic basis of qualitative and quantitative resistance to powdery mildew in wheat: from consensus regions to candidate genes

机译:小麦白粉病定性和定量抗性的遗传基础:从共有区域到候选基因

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摘要

Abstract Background Powdery mildew (Blumeria graminis f. sp. tritici) is one of the most damaging diseases of wheat. The objective of this study was to identify the wheat genomic regions that are involved in the control of powdery mildew resistance through a quantitative trait loci (QTL) meta-analysis approach. This meta-analysis allows the use of collected QTL data from different published studies to obtain consensus QTL across different genetic backgrounds, thus providing a better definition of the regions responsible for the trait, and the possibility to obtain molecular markers that will be suitable for marker-assisted selection. Results Five QTL for resistance to powdery mildew were identified under field conditions in the durum-wheat segregating population Creso × Pedroso. An integrated map was developed for the projection of resistance genes/ alleles and the QTL from the present study and the literature, and to investigate their distribution in the wheat genome. Molecular markers that correspond to candidate genes for plant responses to pathogens were also projected onto the map, particularly considering NBS-LRR and receptor-like protein kinases. More than 80 independent QTL and 51 resistance genes from 62 different mapping populations were projected onto the consensus map using the Biomercator statistical software. Twenty-four MQTL that comprised 2–6 initial QTL that had widely varying confidence intervals were found on 15 chromosomes. The co-location of the resistance QTL and genes was investigated. Moreover, from analysis of the sequences of DArT markers, 28 DArT clones mapped on wheat chromosomes have been shown to be associated with the NBS-LRR genes and positioned in the same regions as the MQTL for powdery mildew resistance. Conclusions The results from the present study provide a detailed analysis of the genetic basis of resistance to powdery mildew in wheat. The study of the Creso × Pedroso durum-wheat population has revealed some QTL that had not been previously identified. Furthermore, the analysis of the co-localization of resistance loci and functional markers provides a large list of candidate genes and opens up a new perspective for the fine mapping and isolation of resistance genes, and for the marker-assisted improvement of resistance in wheat.
机译:摘要背景白粉病(Blumeria graminis f。sp。tritici)是小麦中最具破坏性的疾病之一。这项研究的目的是通过定量性状基因座(QTL)荟萃分析方法来确定参与控制白粉病抗性的小麦基因组区域。这项荟萃分析允许使用从不同发表的研究中收集的QTL数据来获得不同遗传背景下的共有QTL,从而更好地定义了负责该性状的区域,并有可能获得适合于标记的分子标记辅助选择。结果在田间条件下,在硬粒小麦和小麦隔离种群Creso×Pedroso中鉴定出五个抗白粉病的QTL。根据本研究和文献,绘制了一个综合图谱来预测抗性基因/等位基因和QTL,并研究它们在小麦基因组中的分布。对应于植物对病原体反应的候选基因的分子标记也被投影到了图上,特别是考虑到NBS-LRR和受体样蛋白激酶。使用Biomercator统计软件,将来自62个不同作图群体的80多个独立QTL和51个抗性基因投影到共有图谱上。在15条染色体上发现了24个包含2-6个初始QTL的MQTL,它们的置信区间相差很大。研究了抗性QTL和基因的共位。此外,从对DArT标记序列的分析来看,已定位在小麦染色体上的28个DArT克隆与NBS-LRR基因相关,并且与白粉病抗性位于与MQTL相同的区域。结论本研究结果为小麦抗白粉病的遗传基础提供了详细的分析。对Creso××Pedroso硬质小麦种群的研究发现了一些以前未发现的QTL。此外,对抗性基因座和功能标记的共定位分析提供了大量候选基因,并为抗性基因的精细定位和分离以及小麦抗性的标记辅助改良打开了新的前景。

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